Contents

Note: Only underlined entries are included on this CD-ROM. See About ED&TC 95 for explanation.

Foreword to EDAC-ETC-EuroASIC 94
Organizing and Program Committee
Technical Program Committee
Tutorials
List of Reviewers
EDAC-ETC-EuroASIC 1995


Session 1A: Processor Architecture

Design and Implementation of a High-Performance, Modular, Sorting Engine
G. Alexiou, D. Stiliadis, and N. Kanopoulos

Design of High Complexity Superscalar Microprocessor with the Portable IDPS ASIC Library
A. Greiner, L. Lucas, F. Wajsbürt, and L. Winckel

Taking Advantage of ASICs to Improve Dependability with Very Low Overheads
T. Michel, R. Leveugle, G. Saucier, R. Doucet, and P. Chapier


Session 1B: System Level Transformation and Micro Code Generation

Control Flow Optimization for Fast System Simulation and Storage Minimization
F. Franssen, L. Nachtergaele, H. Samsom, F. Catthoor and H. De Man

Maximizing the Throughput of High Performance DSP Applications Using Behavioral Transformations
S.-H. Huang and J.M. Rabaey

Instruction-Set Matching and Selection for DSP and ASIP Code Generation
C. Liem, T. May, and P. Paulin


Session 1C: Testing Sequential Circuits

Application of Simple Genetic Algorithms to Sequential Circuit Test Generation
E.M. Rudnick, J.G. Holm, D.G. Saab, and J.H. Patel

TORSIM: An Efficient Fault Simulator for Synchronous Sequential Circuits
S. Gai, P.L. Montessoro, and M. Sonza Reorda

A Functional Approach to Delay Faults Test Generation for Sequential Circuits
F. Fummi, D. Sciuto, and M. Serra


Session 2A: System Design and Mixed A/D Synthesis

Logic Synthesis and Verification of the CPU and Caches of a Mainframe System
H.N. Nguyen, J.P. Tual, L. Ducousso, M. Thill, and P. Vallet

ICM2 IC: A New ATM Switching Element for 2.48 Gb/s Communications
F. Calvo, P. Plaza, and P. Mateos

Advanced Analog Circuit Design on a Digital Sea-of-Gates Array
R. van Dongen and V. Rikkink

Switched Current Sigma-Delta A/D Converter for a CMOS Subscriber Line Analog Front End
D. Gevaert, J. Vanneuville, J. Nedved, and J. Sevenhans


Session 2B: Circuit Optimization and Partitioning

Delay Reduction by Segment Substitution
H. Ahuja and P. R. Menon

Introduction of Permissible Bridges with Application to Logic Optimization afterTechnology Mapping
B. Rohfleisch and F. Brglez

High-Level Synthesis of Digital Circuits by Finding Fixpoints
L. Ghatraju, M.H. Abd-El-Barr, and C. McCrosky

FPGA Partitioning For Critical Paths
D. Brasen And G. Saucier


Session 2C: BIST Techniques

A Low Cost BIST Methodology and Associated Novel Test Pattern Generator
S.-P. Lin, S.K. Gupta, and M.A. Breuer

Signature Analysis for Sequential Circuits with Reset
A. P. Stroele

Fine-Grained Concurrency in Test Scheduling for Partial-Intrusion BIST
I.G. Harris and A. Orailoglu

A Fragmented Register Architecture and Test Advisor for BIST
R.J. Illman and D.J. Traynor


Session 3A: Finite State Machine Verification

Bug Identification of a Real Chip Design by Symbolic Model Checking
B. Chen, M. Yamazaki, and M. Fujita

A State Space Decomposition Algorithm for Approximate FSM Traversal
H. Cho, G.D. Hachtel, E. Macii, M. Poncino, and F. Somenzi

An OBDD-Representation of Statecharts
J. Helbig and P. Kelb


Panel Session 3B: Libraries, Models, and Modeling: The Real Challenge

Coordinator: J. Mucha, University of Hannover, Germany
Chairman: E. Barke, University of Hannover, Germany

Panel:
J. Benkoski, SGS-Thomson Microelectronics, France
P. Bricaud, Compass Design Automation, France
S. Hamacher, Mentor Graphics, Germany
D. Laurent, BULL SA, France
W. Ries, Siemens AG-Semiconductor Group, Germany
W. Stronski, Cadence Design Systems, Germany
P. van Staa, Robert Bosch GmbH, Germany


Session 3C: Fault Modeling

A Functionality Fault Model: Feasibility and Applications
A. Zemva, F. Brglez, K. Kozminski, and B. Zajc

Modeling of Broken Connections Faults in CMOS ICs
M. Favalli, M. Dalpasso, P. Olivo, and B. Riccò

Generating Test Patterns for Bridge Faults in CMOS ICs
B. Chess and T. Larrabee

A Hierarchical Approach to Fault Collapsing
R. Hahn, R. Krieger, and B. Becker


Session 4A: Synchronous Finite State Machines

Direct Synthesis of Hazard-Free Asynchronous Circuits from STGs Based on Lock Relation and MG-Decomposition Approach
K.-J. Lin, J.-W. Kuo, and C.-S. Lin

State Minimization of Pseudo Non-Deterministic FSMs
Y. Watanabe and R.K. Brayton

Nondeterministic Finite-State Machines and Sequential Don't Cares
M. Damiani


Session 4B: New BDD-Concepts

Boolean Manipulation with Free BDDs. First Experimental Results
J. Bern, J. Gergov, C. Meinel, and A. Slobodová

An Extended OBDD Representation for Extended FSMs
M. Langevin and E. Cerny

Symbolic Algorithms to Calculate Steady-State Probabilities of a Finite State Machine
G.D. Hachtel, E. Macii, A. Pardo, and F. Somenzi


Session 4C: Applications of Boundary Scan

Self Testable Boards with Standard IEEE 1149.5 Module Test and Maintenance (MTM) Bus Interface
O. F. Haberl and T. Kropf

Random Testing of Interconnects in a Boundary Scan Environment
C. Su

Boundary Scan Testing Combined with Power Supply Current Monitoring
M. Kärkkäinen, K. Tiensyrjä, and M. Weissenfelt


Session 5A: DSP Implementations

Implementation of a CORDIC Processor for CFFT Computation in Gallium Arsenide Technology
R. Sarmiento and K. Eshraghian

PLFP256: A Pipeline Fourier Processor
F. Pogodalla and P. Coulomb

A VLSI Implementation of Parallel Fast Fourier Transform
A. Vacher, M. Benkhebbab, A. Guyot, T. Rousseau, and A. Skaf

Design of a Digital Neural Chip: Application to Optical Character Recognition by Neural Network
D. Jacquet and G. Saucier


Session 5B: Algorithmic Transformations in High-Level Synthesis

An Algorithm for Array Variable Clustering
L. Ramachandran, D.D. Gajski, and V. Chaiyakul

Transforming Linear Systems for Joint Latency and Throughput Optimization
M.B. Srivastava and M. Potkonjak

Genesis: A Behavioral Synthesis System for Hierarchical Testability
S. Bhatia and N.K. Jha

A Synthesis Method for Mixed Synchronous/Asynchronous Behavior
T.-Y. Wu, T.-C. Tien, A.C.-H. Wu, and Y.-L. Lin


Session 5C: DFT for Delay Faults and Sequential Machines

A New BIST Approach for Delay Fault Testing
A. Vuksic and K. Fuchs

BIST Test Pattern Generators for Stuck-Open and Delay Testing
C.-A. Chen and S.K. Gupta

Synthesis of Delay-Verifiable Two-Level Circuits
W. Ke and P. R. Menon

Synthesis of Sequential Machines with Reduced Testing Cost
S.-J. Wang


Session 6A: Estimation During High-Level Synthesis

Incorporating the Controller Effects During Register Transfer Level Synthesis
C. Ramachandran and F.J. Kurdahi

An Algorithm for Generation of Behavioral Shape Functions
N.D. Holmes and D.D. Gajski

Optimal Operation Scheduling Using Resource Lower Bound Estimations
M.E. Dalkilic and V. Pitchumani

Optimization of Address Generator Hardware
D.M. Grant, J. van Meerbergen, and P.E.R. Lippens


Session 6B: Towards Statistical and High-Level Timing Analysis

Predicting Circuit Performance Using Circuit-Level Statistical Timing Analysis
R.B. Brashear, N. Menezes, C. Oh, L.T. Pillage, and M.R. Mercer

Towards Incorporating Device Parameter Variations in Timing Analysis
M. Sivaraman and A.J. Strojwas

A New Model to Uniformly Represent the Function and Timing of MOS Circuits and its Application to VHDL Simulation
J. Frößl and T. Kropf

Taking Advantage of High Level Functional Information to Refine Timing Analysis and Timing Modeling
C. Safinia, R. Leveugle, and G. Saucier


Session 6C: Bridging Faults in Testing

Analysis of Bridging Defects in Sequential CMOS Circuits and their Current Testablity
R. Rodríguez-Montañés and J. Figueras

Transforming Sequential Logic in Digital CMOS ICs for Voltage and IDDQ Testing
M. Sachdev

Test of Bridging Faults in Scan-Based Sequential Circuits
E. Isern and J. Figueras

A Study of Undetectable Non-Feedback Shorts for the Purpose of Physical-DFT
R. McGowen and F.J. Ferguson


Session 7A: Specification and Synthesis of System Interfaces

A Generalized Signal Transition Graph Model for Specification of Complex Interfaces
P. Vanbekbergen, C. Ykman-Couvreur, B. Lin, and H. De Man

Interface Controller Synthesis from Requirement Specifications
F. Korf and R. Schlör

Synthesis of System-Level Bus Interfaces
S. Narayan and D.D. Gajski


Panel Session 7B: New Design Techniques, How Are They Influenced by Test?

Coordinator: J. Mucha, University of Hannover, Germany
Chairman: T.W. Williams, IBM, US

Panel:
K. Baker, Philips, The Netherlands
R. Camposano, Synopsys, US
F. Cathoor, IMEC, Belgium
B. Courtois, INPG/TIMA, France
T. Gheewala, CrossCheck, US
Y. Zorian, AT&T, US


Session 7C: Routing

A Genetic Algorithm for the Steiner Problem in a Graph
H. Esbensen and P. Mazumder

On Design Rule Correct Maze Routing
E.P. Huijbregts, J.T.J. van Eijndhoven and J.A.G. Jess

An Efficient Router for 2-D Field Programmable Gate Arrays
Y.-L. Wu and M. Marek-Sadowska


Session 8A: Performance Issues in Physical Design

A Method for Reducing Power Consumption of CMOS Logic Based on Signal Transition Probability
J. Akita and K. Asada

Cell Height Driven Transistor Sizing in a Cell Based Module Design
H.-R. Lin, C.-L. Chou, Y.-C. Hsu, and T.-T. Hwang

Non-Tree Routing
B.A. McCoy and G. Robins


Panel Session 8B: Small and Medium Sized Industries (SMIs), Do They Get What They Need?

Coordinator: J. Mucha, University of Hannover, Germany
Chairman: G.A. Schwippert, CME Delft, The Netherlands

Panel:
D. Langlois, MISIL Technologies, France
A.T. Sauer, SNI, Germany
O. Rønning, Nordic VLSI, Norway
W. Rehr, IAM, Germany
R.L. van der Valk, Bureau van der Valk, The Netherlands
A.D. Milne, Wolfson Microelectronics Ltd., UK


Session 8C: Various Views on Testing Efficiency

Fault Modeling and Defect Level Projections in Digital Ics
J.T. Sousa, F.M. Gonçalves, J.P. Teixeira, and T.W. Williams

Probability Analysis for CMOS Floating Gate Faults
H. Xue, C. Di, and J.A.G. Jess

M-Testability: An Approach for Data-Path Testability Evaluation
M. Jamoussi and B. Kaminska


Session 9A: Design Methodologies for the System-Level

A System-Design Methodology: Executable-Specification Refinement
D.D. Gajski, F. Vahid, and S. Narayan

Interactive System-Level Partitioning with PARTIF
T.B. Ismail, K. O'Brien, and A. Jerraya

A Development Environment for the Cosynthesis of Embedded Software/Hardware Systems
M. Edwards and J. Forrest

High-Level Design Validation Using Algorithmic Debugging
J. Naganuma, T. Ogura, and T. Hoshino


Session 9B: Applications of Scheduling in High-Level Synthesis

Component Selection, Scheduling and Control Schemes for High Level Synthesis.
B. Rouzeyre, D. Dupont, and G. Sagnes

Optimal Scheduling and Software Pipelining of Repetitive Signal Flow Graphs with Delay Line Optimization
F. Depuydt, W. Geurts, G. Goossens, and H. De Man

Scheduling with Environmental Constraints Based on Automata Representations
J.C.-Y. Yang, G. De Micheli, and M. Damiani

Signal Type Optimisation in the Design of Time-Multiplexed DSP Architectures
K. Schoofs, G. Goossens, and H. De Man


Session 9C: Delay Test

TRANS: A Fast and Memory-Efficient Path Delay Fault Simulator
M.C. Lin, J.E. Chen, and C.L. Lee

Efficient Path Identification for Delay Testing - Time and Space Optimization
H. Wittmann and M. Henftling

Effectiveness of a Variable Sampling Time Stategy for Delay Fault Diagnosis
D. Dumas, P. Girard, C. Landrault, and S. Pravossoudovitch

Gate-Delay Fault Test with Conventional Scan-Design
A. Kunzmann and F. Böhland


Session 10A: Tools and Methods for Analogue System Design

A Methodology for Analog Design Automation in Mixed-Signal ASICs
S. Donnay, K. Swings, G. Gielen, W. Sansen, W. Kruiskamp, and D. Leenaerts

A Graphical Approach to Analogue Behavioural Modelling
V. Moser, P. Nussbaum, H.P. Amann, L. Astier, and F. Pellandini

An Overview of Analogue Optimisation Using “AD-OP
T” E. Byrne, O. McCarthy, D. Lucas, and B. Donnellan

A Reduced-Swing Data Transformation Scheme for Resistive Bus Lines in VLSIs
M. Ikeda and K. Asada


Session 10B: Logic, Circuit, and Yield Simulation Technologies

Logic and Fault Simulation by Cellular Automata
Y.-L. Li and C.-W. Wu

Variable Accuracy Device Modeling for Event-Driven Circuit Simulation
K.W. Michaels and A.J. Strojwas

An Accurate Time-Domain Current Waveform Simulator for VLSI Circuits
J.-H. Wang, J.-T. Fan, and W.-S. Feng

An Efficient Yield Optimization Method Using a Two Step Linear Approximation of Circuit Performance
Z. Wang and S.W. Director


Session 10C: DFT for Datapaths, Controllers, and Arrays

Efficient Implementations of Self-Checking Multiply and Divide Arrays
M. Nicolaidis and H. Bederr

Synthesis of Self-Testable Controllers
S. Hellebrand and H.-J. Wunderlich

A Stepwise Refinement Data Path Synthesis Procedure for Easy Testability
T. Kim, K.-S. Chung, and C.L. Liu

Automatic Synthesis of BISTed Data Paths from High Level Specification
M.L. Flottes, D. Hammad, and B. Rouzeyre


Session 11A: Framework Services for Productivity Improvement

HANDICAP - A System for Design Consulting
M. Straube, W. Wilkes, and G. Schlageter

Flow Management Requirements of a Test Harness for Testing the Reliability of an Electronic CAD System
G. Bartels, P. Kist, K. Schot, and M. Sim

Distributed Computing, Automatic Design, and Error Recovery in the Ulysses II Framework
S.Parikh, M.L. Bushnell, J. Sienicki, and R. Ganesh


Session 11B: Techniques and Applications for BDDs

Minimizing ROBDD Size of Incompletely Specified Multiple Output Functions
S.-C. Chang, D.I. Cheng and M. Marek-Sadowska

Timing Analysis of Combinational Circuits Using ADD's
R.I. Bahar, H. Cho, G.D. Hachtel, E. Macii, and F. Somenzi

Efficient Calculation of Boolean Relations for Multi-Level Logic Optimization
B. Wurth and N. Wehn


Session 11C: High-Level Verification

System-Level Modeling and Verification: A Comprehensive Design Methodology
P. Camurati, F. Corno, P. Prinetto, C. Bayol, and B. Soulas

Clean Formal Semantics for VHDL
P.T. Breuer, L. Sánchez Fernández, and C. Delgado Kloos

Control Path Oriented Verification of Sequential Generic Circuits with Control and Data Path
K. Schneider, T. Kropf, and R. Kumar


Poster Session

The Russian EDA Standards Activities
N.M. Vitsyn

"Underground Capacitors" - Very Efficient Decoupling for High Performance UHF Signal Processing ICs
T. Johansson, L. R. Virtanen and J.M. Gobbi

Design of a Real Time Geometric Classifier
M. Robert, S. Turgis, P. Gorria, and J. Mitéran

From Behavioral Description to Systolic Array Based Architectures
A. Balboni, C. Costi, F. Fummi, and D. Sciuto

Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits
A. Abderrahman, B. Kaminska, and Y. Savaria

AREAL: Automated Reasoning Expert for Analog Layout
H.H. Ahmad and R.J. Mack

An Optimizable Model for Process Independent Symbolic Design
J.-C. Dufourd and J.-F. Naviner

Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning
W.C. Wu, C.L. Lee, J.E Chen and W.Y. Lin

A Suggestion for Accelerating the Analog Fault Simulation
W. Vermeiren, B. Straube, and G. Elst

Software Implementation and Statistical Optimization of Some Electronic Components Lifetime
K.C. Kouakou

Physical Modeling of Linearity Errors for the Diagnosis of High Resolution R-2R D/A Converters
A. Boni, G. Chiorboli, G. Franco, S. Mazzoleni, and M. Ostacoli

A Model-Based Approach to Analog Fault Diagnosis Using Techniques from Optimization
S. Ahmed, P.Y.K. Cheung, and P. Collins

Functional Tests for Ring-Address SRAM-Type FIFOs
A.J. van de Goor, I. Schanstra, and Y. Zorian

Testability of Circuits Derived from Functional Decision Diagrams
B. Becker and R. Drechsler

A Redefinable Symbolic Simulation Technique to Testability Design Rules Checking
O. Florent, A. Greiner, M. Hirech, and E. Rejouan

Multilevel Logic Synthesis of Very High Complexity Circuits
L. Burgun, N. Dictus, A. Greiner, E. Pradho, and C. Sarwary

Signal Transition Graph Transformations for Initializability
S. Banerjee, R.K. Roy, S.T. Chakradhar, and D.K. Pradhan

Synthesis of Applications-Specific Multiprocessor Systems
M.K. Dhodhi, I. Ahmed, and C.Y.R. Chen

Generating Synchronous Timed Descriptions of Digital Receivers from Dynamic Data Flow System Level Configurations
P. Zepter and T. Grötker

Index of Authors